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Carrier recombination rates in strained-layer InGaAs-GaAs quantum wells

✍ Scribed by Chen, Y.-C.; Wang, P.; Coleman, J.J.; Bour, D.P.; Lee, K.K.; Waters, R.G.


Book ID
117869782
Publisher
IEEE
Year
1991
Tongue
English
Weight
516 KB
Volume
27
Category
Article
ISSN
0018-9197

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