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Capacitance—Voltage Relations of Schottky and p—n Diodes in the Presence of both Shallow and Deep Impurities

✍ Scribed by C. van Opdorp

Publisher
John Wiley and Sons
Year
1969
Tongue
English
Weight
465 KB
Volume
32
Category
Article
ISSN
0370-1972

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Determination of the interface state den
Determination of the interface state density of the In/p-Si Schottky diode by conductance and capacitance–frequency characteristics
✍ N. Tuğluoğlu; F. Yakuphanoglu; S. Karadeniz 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 339 KB

The electrical characterization of the In/p-Si Schottky diode has been investigated by conductance and capacitance-frequency techniques. The characteristic parameters of the interface states have been determined from the capacitance-frequency and conductance-frequency measurements. The capacitance o