Computer software for specimen orientation adjustment relative to the incident electron beam has been developed. The difficulties encountered when tilting severely strained, highly beam-sensitive, or small-grain-size specimens with known structures using either a double-tilt or a rotation holder in
Calculation of tilt angles for crystal specimen orientation adjustment using double-tilt and tilt-rotate holders
โ Scribed by Liu Qing; Meng Qing-Chang; Hong Bande
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 396 KB
- Volume
- 20
- Category
- Article
- ISSN
- 0739-6260
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โฆ Synopsis
In thiscommunication we wish to present a group ofnew equations which can be used to calculate the tilt angle for crystal specimen orientation adjustment in the transmission electron microscope. The experiments were concerned with double-tilt and tilt-rotate holders and the new equations deduced using matrix geometry. The specimen orientation adjustment using the tilt angles calculated by these equations is considered to be more convenient and less time-consuming than following the Kikuchi map method. Our method avoids the difficulties associated with orientation adjustment of severely strained and small grain size specimens using the Kikuchi map procedure. The algorithms for deducing the new equations, together with an experimental example using the equations, are described.
๐ SIMILAR VOLUMES
A simple formula has been derived for the tilt angle of a specimen in terms of the two tilt angles of a side entry, double tilt holder in a transmission electron microscope. An expression for calculating the direction of the apparent tilt axis in relation to the observed diffraction pattern has also