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Calculation of overall tilt angles for a double tilt holder in a TEM

✍ Scribed by Dr. Patrick M. Kelly; Corinna J. Wauchope; Xuezhi Zhang

Publisher
John Wiley and Sons
Year
1994
Tongue
English
Weight
405 KB
Volume
28
Category
Article
ISSN
1059-910X

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✦ Synopsis

A simple formula has been derived for the tilt angle of a specimen in terms of the two tilt angles of a side entry, double tilt holder in a transmission electron microscope. An expression for calculating the direction of the apparent tilt axis in relation to the observed diffraction pattern has also been derived. The accuracy and reproducibility of specimen tilting has been assessed experimentally.

Angular relationship, Tilting, Electron microscopy, Goniometer o 1994 Wiley-Liss, Inc.

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