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Calculating the trap density of states in organic field-effect transistors from experiment: A comparison of different methods

✍ Scribed by Kalb, Wolfgang L.; Batlogg, Bertram

Book ID: 126548901
Publisher: The American Physical Society
Year: 2010
Tongue: English
Weight: 675 KB
Volume: 81
Category: Article
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.81.035327

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