A comparison of the trap properties and locations within GaAs field effect transistors measured under different bias conditions

✍ Scribed by Azhar Iqbal, M.; Jones, B.K.

• Book ID: 114537379
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 167 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.704361