C60 films on surface-treated silicon: recipes for amorphous and crystalline growth
β Scribed by A.F. Hebard; O. Zhou; Q. Zhong; R.M. Fleming; R.C. Haddon
- Book ID
- 103431996
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 790 KB
- Volume
- 257
- Category
- Article
- ISSN
- 0040-6090
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Molecular arrangements in CM and C,u films grown epitaxially on GaSe and Moss have been studied by reflection high-energy electron diffraction. C, and C,u molecules were found to form close-packed hexagonal lattices on these substrates with lattice constants of 1.00 LO.02 and 1.08 & 0.02 nm, respect
We present a measurement of the C ls ionisation potential (IP) for solid C60, as well as a reliable determination of the highest occupied molecular orbital (HOMO) IP. The difference between the gas phase and solid state measurements for the HOMO agrees well with theory. We discuss these results with