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Low temperature NH3 adsorption on clean amorphous silicon and on crystalline silicon surfaces and nitrogen bonding in hydrogenated amorphous silicon nitride films: A comparative X-ray photoelectron spectroscopy study

✍ Scribed by L Kubler; E.K Hilil; D Bolmont; J.C Peruchetti


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
439 KB
Volume
149
Category
Article
ISSN
0040-6090

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