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BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic

✍ Scribed by J. Franco; S. Graziano; B. Kaczer; F. Crupi; L.-Å. Ragnarsson; T. Grasser; G. Groeseneken

No coin nor oath required. For personal study only.

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Analytical models of subthreshold swing

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Impact of Quantum Confinement on Backgat

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