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Impact of Quantum Confinement on Backgate-Bias Modulated Threshold-Voltage and Subthreshold Characteristics for Ultra-Thin-Body GeOI MOSFETs
✍ Scribed by Chang-Hung Yu; Yu-Sheng Wu; Hu, V.P.-H.; Pin Su
- Book ID
- 114620986
- Publisher
- IEEE
- Year
- 2012
- Tongue
- English
- Weight
- 711 KB
- Volume
- 59
- Category
- Article
- ISSN
- 0018-9383
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