๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Breakdown in a two-layer film of tantalum pentoxide

โœ Scribed by G. A. Vorob'ev; V. V. Motoshkin

Book ID
112480943
Publisher
Springer
Year
1975
Tongue
English
Weight
73 KB
Volume
18
Category
Article
ISSN
1573-9228

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Refractive index of a tantalum pentoxide
Refractive index of a tantalum pentoxide film
โœ Malacara-Hernandez, Zacarias ;Baumeister, Philip ๐Ÿ“‚ Article ๐Ÿ“… 1980 ๐Ÿ› The Optical Society ๐ŸŒ English โš– 673 KB
Effect of a silicon nitride buffer layer
Effect of a silicon nitride buffer layer on the electrical properties of tantalum pentoxide films
โœ B.Y. Wang; Hao Wang; C. Ye; Y. Wang; Y. Ye; W.F. Wang ๐Ÿ“‚ Article ๐Ÿ“… 2010 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 495 KB

Ta 2 O 5 films with a buffer layer of silicon nitride of various thicknesses were deposited on Si substrate by reactive sputtering and submitted to annealing at 700 ยฐC in nitrogen atmosphere. The microstructure and the electrical properties of thin films were studied. It was found that with a buffer

Raman scattering study of a phase transi
Raman scattering study of a phase transition in tantalum pentoxide
โœ P. S. Dobal; R. S. Katiyar; Y. Jiang; R. Guo; A. S. Bhalla ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 98 KB ๐Ÿ‘ 2 views

Ta 2 O 5 ceramics and crystals were prepared and analyzed using Raman spectroscopy in the temperature range 25-873 K. The low-energy phonon bands (n < 100 cm -1 ) of Ta 2 O 5 are assigned to external modes originating from the interaction between different Ta polyhedra and TaO n 5-2n -Ta 6 O 12 6Y c