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Bragg reflectivity of layered synthetic microstructures in the x-ray anomalous scattering regions

✍ Scribed by Marmoret, R. ;André, J. M.

Book ID: 115331154
Publisher: The Optical Society
Year: 1983
Tongue: English
Weight: 765 KB
Volume: 22
Category: Article
ISSN: 1559-128X
DOI: 10.1364/AO.22.000017

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## Measurements of long-wavelength x-rays emitted by light elements can be achieved by using selected layered synthetic microstructures (LSM). For both C Ka and N Ka radiation, W/Si (d = 3.25 nm) LSM was used. Because of the counter efficiency, the C Ka emission has the highest intensity in spite o