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Comparison between Ti anomalous x-ray scattering factors obtained from layered synthetic microstructures and the dispersion relationship

✍ Scribed by Warburton, W. K.; Ludwig, K. F.; Barbee, T. W.


Book ID
115392366
Publisher
Optical Society of America
Year
1985
Tongue
English
Weight
285 KB
Volume
2
Category
Article
ISSN
0740-3224

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