Use of layered synthetic microstructures for the quantitative x-ray analysis of light elements

✍ Scribed by C. Hombourger; P. Jonnard; J. -M. André; J. -P. Chauvineau

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 86 KB
• Volume: 28
• Category: Article
• ISSN: 0049-8246
• DOI: 10.1002/(sici)1097-4539(199905/06)28:3<163::aid-xrs331>3.0.co;2-z

✦ Synopsis

Measurements

of long-wavelength x-rays emitted by light elements can be achieved by using selected layered synthetic microstructures (LSM). For both C Ka and N Ka radiation, W/Si (d = 3.25 nm) LSM was used. Because of the counter efficiency, the C Ka emission has the highest intensity in spite of a calculated reflectivity of the W/Si LSM in favor of the N Ka emission. For B Ka radiation, Mo/Si (d = 5.0 nm), B/Si (d = 4.6 nm) and Ni/C (d = 4.8 nm) LSM were used. Ni/C LSM is the best LSM for the B Ka range because in B/Si LSM the presence of boron gives rise to the anomalous diffusion phenomenon. The intensity, peak-to-background ratio and experimental resolution are better for Ni/C than for Mo/Si LSM.