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Boron-doped a-Si:Hâc-Si interface passivation: Degradation mechanism

✍ Scribed by De Wolf, Stefaan; Kondo, Michio

Book ID: 121222886
Publisher: American Institute of Physics
Year: 2007
Tongue: English
Weight: 611 KB
Volume: 91
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2783972

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