๐”– Bobbio Scriptorium
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Bipolar transistor degradation under dynamic hot carrier stress

โœ Scribed by Tadahiko Horiuchi; J. David Burnett; Chenming Hu


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
296 KB
Volume
38
Category
Article
ISSN
0038-1101

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