Degradation of bipolar junction transistors under dynamic high current stress and biased in open-collector condition

✍ Scribed by Ping-Chen Chang; Sheng-Lyang Jang; Young-Shying Chen

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 429 KB
• Volume: 37
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(94)90082-5