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Bias stress instability in pentacene thin film transistors: Contact resistance change and channel threshold voltage shift

✍ Scribed by Wang, S. D.; Minari, T.; Miyadera, T.; Aoyagi, Y.; Tsukagoshi, K.

Book ID
121211726
Publisher
American Institute of Physics
Year
2008
Tongue
English
Weight
647 KB
Volume
92
Category
Article
ISSN
0003-6951

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