Electrical-Stress-Induced Threshold Voltage Instability in Solution-Processed ZnO Thin-Film Transistors: An Experimental and Simulation Study

✍ Scribed by Gupta, D.; Seunghyup Yoo; Changhee Lee; Yongtaek Hong

• Book ID: 114620472
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 548 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2011.2138143