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Behavioral electromagnetic models of high-speed p-i-n photodiodes

✍ Scribed by Chenhui Jiang; Viktor Krozer; Tom K. Johansen; Heinz-Gunter Bach; Giorgis G. Mekonnen; Lei Yan


Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
545 KB
Volume
53
Category
Article
ISSN
0895-2477

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✦ Synopsis


Abstract

This article presents a methodology for developing small‐signal behavioral electromagnetic (EM) models of p‐i‐n photodiodes (PDs) for high‐speed applications. The EM model includes RC bandwidth limitation effect and transit‐time effect. The model is capable of accurately modeling arbitrary complex parasitics of PD chips. It can be used to predict the optical‐to‐electrical (O/E) response of PDs with various p‐i‐n junction structures in the frequency domain at the behavioral level. Compared to equivalent circuit models, EM models avoid developing complicated circuit network to represent complex chip parasitics as well as extracting parasitic values and provide straightforward access to EM characteristics of devices. © 2011 Wiley Periodicals, Inc. Microwave Opt Technol Lett 53:2530–2533, 2011; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.26327


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