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Beam tests of a Fast-RICH prototype with VLSI readout electronics

✍ Scribed by J. Séguinot; T. Ypsilantis; J.P. Jobez; R. Arnold; J.L. Guyonnet; E. Chesi; J. Tischhauser; I. Adachi; T. Sumiyoshi; R.J. Mountain

No coin nor oath required. For personal study only.

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