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Beam test of a full-length prototype of the BESIII drift chamber with the readout electronics

✍ Scribed by Z.H. Qin; Y.B. Chen; H.Y. Sheng; L.H. Wu; J.B. Liu; B.A. Zhuang; X.S. Jiang; Y.B. Zhao; K.J. Zhu; Z.K. Yan; C. Chen; M.H. Xu; L. Wang; X.Y. Ma; X. Tang; R.G. Liu; Y. Jin; Q.M. Zhu; G.F. Zhang; Z. Wu; R.Y. Li; P.P. Zhao; H.L. Dai; X.P. Li; J. Li


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
964 KB
Volume
571
Category
Article
ISSN
0168-9002

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