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Beam tests of silicon microstrip detectors with VLSI readout

✍ Scribed by W. Ross; H. Attias; K. Barger; G. Kalbfleisch; D. Kaplan; P. Karchin; J. Kuehler; M. Lambrecht; E. McCliment; J. Sinnott; P. Skubic; S. Utku

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 196 KB
Volume: 310
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(91)91087-c

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