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Beam test results of an ion-implanted silicon strip detector on a 100 mm wafer

✍ Scribed by I. Hietanen; J. Lindgren; R. Orava; T. Tuuva; R. Brenner; M. Andersson; K. Leinonen; H. Ronkainen; L. Hubbeling; M. Turala; W. Dulinski; D. Husson; A. Lounis; M. Schaeffer; R. Turchetta; J. Chauveau

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 197 KB
Volume: 305
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(91)90531-t

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