✦ LIBER ✦

Beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm silicon wafer

✍ Scribed by I. Hietanen; J. Lindgren; R. Orava; T. Tuuva; R. Brenner; M. Andersson; K. Leinonen; H. Ronkainen; M. Turala; P. Weilhammer; W. Dulinski; D. Husson; A. Lounis; M. Schaeffer; R. Turchetta; J. Chauveau

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 380 KB
Volume: 310
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(91)91116-d

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Beam test results of an ion-implanted si

Beam test results of an ion-implanted silicon strip detector on a 100 mm wafer

✍ I. Hietanen; J. Lindgren; R. Orava; T. Tuuva; R. Brenner; M. Andersson; K. Leino 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 197 KB

Ion-implanted capacitively coupled silic

Ion-implanted capacitively coupled silicon strip detectors with integrated polysilicon bias resistors processed on a 100 mm wafer

✍ Iiro Hietanen; Jukka Lindgren; Risto Orava; Tuure Tuuva; Martti Voutilainen; Ric 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 604 KB

Ion-implanted silicon detectors processe

Ion-implanted silicon detectors processed on a 100 mm wafer

✍ Iiro Hietanen; Jukka Lindgren; Risto Orava; Tuure Tuuva; Richard Brenner; Mikael 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 332 KB