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Ballistic electron emission microscopy to probe interfaces of simple device structures

✍ Scribed by Mao-long Ke; R.H. Williams; D.I. Westwood; B.E. Richardson

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 629 KB
Volume: 31
Category: Article
ISSN: 0167-9317
DOI: 10.1016/0167-9317(95)00343-6

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