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Automatic measurement of the output voltage of linear integrated circuits

โœ Scribed by M. S. Garibyan; F. G. Garunts


Book ID
112414606
Publisher
Springer US
Year
1972
Tongue
English
Weight
238 KB
Volume
15
Category
Article
ISSN
0543-1972

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Measurement of substrate noise in CMOS i
โœ Keiko Makie-Fukuda; Takanobu Anbo; Toshiro Tsukada ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 175 KB

It is important to reduce substrate noise in the analog/digital mixed-signal integrated circuits. In order to understand the influence of substrate noise, a technique to measure substrate noise using a chopper-type voltage comparator based on an equivalent sampling method is proposed. The substrate