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Voltage-comparator-based measurement of equivalently sampled substrate noise waveforms in mixed-signal integrated circuits

✍ Scribed by Makie-Fukuda, K.; Anbo, T.; Tsukada, T.; Matsuura, T.; Hotta, M.

Book ID: 119774548
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 542 KB
Volume: 31
Category: Article
ISSN: 0018-9200
DOI: 10.1109/4.509856

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