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Substrate noise measurement by using noise-selective voltage comparators in analog and digital mixed-signal integrated circuits

โœ Scribed by Makie-Fukuda, K.; Anbo, T.; Tsukada, T.

Book ID
114544446
Publisher
IEEE
Year
1999
Tongue
English
Weight
126 KB
Volume
48
Category
Article
ISSN
0018-9456

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Measurement of substrate noise in CMOS i
Measurement of substrate noise in CMOS integrated circuits by using chopper-type voltage comparators
โœ Keiko Makie-Fukuda; Takanobu Anbo; Toshiro Tsukada ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 175 KB

It is important to reduce substrate noise in the analog/digital mixed-signal integrated circuits. In order to understand the influence of substrate noise, a technique to measure substrate noise using a chopper-type voltage comparator based on an equivalent sampling method is proposed. The substrate