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Voltage measurements on integrated circuits using a time-of-flight electron spectrometer

✍ Scribed by A.R. Dinnis; A. Khursheed

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 316 KB
Volume: 23
Category: Article
ISSN: 0167-9317
DOI: 10.1016/0167-9317(94)90181-3

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