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Automatic determination of recrystallization parameters in metals by electron backscatter pattern line scans

✍ Scribed by Axel W Larsen; Dorte Juul Jensen

Book ID: 113779731
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 518 KB
Volume: 51
Category: Article
ISSN: 1044-5803
DOI: 10.1016/j.matchar.2004.01.001

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