Determination of the crystallographic parameters of a fcc metal by means of electron channelling patterns
β Scribed by A. Uguz
- Publisher
- John Wiley and Sons
- Year
- 2003
- Tongue
- English
- Weight
- 288 KB
- Volume
- 38
- Category
- Article
- ISSN
- 0232-1300
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β¦ Synopsis
Abstract
Indexing and mapping of selected area electron channelling patterns (SAECPs) of an AlβZnβMg alloy have been performed. Although, channelling patterns are similar for crystals having the same system, since the interplanar spacing and the angular band width depend on lattice parameter, the details of the map will differ for every material. Angles between the poles and the angular separations of channelling bands were measured on the micrographs and calculated with the well known equations and found to be well in agreement within the error limits. Also the channelling line widths were calculated with the help of extinction distances of the reflecting planes. Structure factors and atomic scattering factors for selected reflections were also calculated for the present alloy whose a = 4.054 Γ .
π SIMILAR VOLUMES
Elastic peak depth proΓling was carried out on an Mo/Si multilayer system using a rotating specimen, grazing angle of incidence (86Γ with respect to the surface normal) and 0.5 keV Ar ion energy. The depth proΓling was simulated by dynamic TRIM (T-DYN) code. The T-DYN code provided the in-depth dist