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Detection of recrystallized structure by means of automatic analysis of electron backscattered diffraction patterns

✍ Scribed by T. N. Konkova; S. Yu. Mironov; A. V. Korznikov; M. M. Myshlyaev

Book ID: 114992536
Publisher: SP MAIK Nauka/Interperiodica
Year: 2012
Tongue: English
Weight: 459 KB
Volume: 54
Category: Article
ISSN: 1063-7834
DOI: 10.1134/s1063783412040130

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