𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Auger Depth Profile Analysis of Deeply Buried Interfaces

✍ Scribed by Barna, A. ;Menyhard, M.

Publisher
John Wiley and Sons
Year
1994
Tongue
English
Weight
832 KB
Volume
145
Category
Article
ISSN
0031-8965

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

2504. Auger depth profiling of interface
2504. Auger depth profiling of interfaces in MOS and MNOS structures
πŸ“‚ Article πŸ“… 1977 πŸ› Elsevier Science 🌐 English βš– 150 KB

conduction band potential obtained from the threshold measurements shows only a small deviation from a fiat band, less than β€’ i 0.05 eV, tip to a point 4 A, from the silicon surface. There is no indication of a large ionic charge or of a greatly reduced SiO, bandgap to within about two lattice units

Refined Approach to PCA-assisted Auger D
Refined Approach to PCA-assisted Auger Depth Profile Analysis
✍ SchΓΆpke, A.; Kelling, S. πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 360 KB πŸ‘ 1 views

A reÐned approach to the calculation of Auger depth proÐles by means of principal component analysis (PCA) is presented. The reÐnement consists of the use of normalized spectra. In this way, a more reliable determination of the number of chemical compounds and their location in the depth proÐle is p