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Atomistic treatment of interface roughness in Si nanowire transistors with different channel orientations

✍ Scribed by Luisier, Mathieu; Schenk, Andreas; Fichtner, Wolfgang

Book ID
120372623
Publisher
American Institute of Physics
Year
2007
Tongue
English
Weight
461 KB
Volume
90
Category
Article
ISSN
0003-6951

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