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Atomic Force Microscopy Study of Self-Affine Fractal Roughness of Porous Silicon Surfaces

✍ Scribed by Happo, Naohisa; Fujiwara, Makoto; Iwamatsu, Masao; Horii, Kenju

Book ID
111689371
Publisher
Institute of Pure and Applied Physics
Year
1998
Tongue
English
Weight
745 KB
Volume
37
Category
Article
ISSN
0021-4922

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