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Atomic Force Microscopy Scanning Tunneling Microscopy

✍ Scribed by Samuel H. Cohen, Marcia L. Lightbody

Publisher
Springer
Year
1999
Tongue
English
Leaves
219
Edition
1
Category
Library
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✦ Synopsis

This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written by experts in probe microscopy from around the world, representing a wide range of disciplines, including physics, biotechnology, nanotechnology, chemistry, and materials science.

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