Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy

✍ Scribed by Bert Voigtländer (auth.)

Publisher: Springer-Verlag Berlin Heidelberg
Year: 2015
Tongue: English
Leaves: 375
Series: NanoScience and Technology
Edition: 1
Category: Library

No coin nor oath required. For personal study only.

✦ Synopsis

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

✦ Table of Contents

Front Matter....Pages i-xv
Introduction....Pages 1-11
Front Matter....Pages 13-13
Harmonic Oscillator....Pages 15-29
Technical Aspects of Scanning Probe Microscopy....Pages 31-63
Scanning Probe Microscopy Designs....Pages 65-76
Electronics for Scanning Probe Microscopy....Pages 77-99
Lock-In Technique....Pages 101-105
Data Representation and Image Processing....Pages 107-114
Artifacts in SPM....Pages 115-121
Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy....Pages 123-133
Surface States....Pages 135-141
Front Matter....Pages 143-143
Forces Between Tip and Sample....Pages 145-155
Technical Aspects of Atomic Force Microscopy (AFM)....Pages 157-175
Static Atomic Force Microscopy....Pages 177-186
Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy....Pages 187-204
Intermittent Contact Mode/Tapping Mode....Pages 205-221
Mapping of Mechanical Properties Using Force-Distance Curves....Pages 223-227
Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy—Non-contact Atomic Force Microscopy....Pages 229-253
Noise in Atomic Force Microscopy....Pages 255-267
Quartz Sensors in Atomic Force Microscopy....Pages 269-275
Front Matter....Pages 277-277
Scanning Tunneling Microscopy....Pages 279-308
Front Matter....Pages 277-277
Scanning Tunneling Spectroscopy (STS)....Pages 309-334
Vibrational Spectroscopy with the STM....Pages 335-340
Spectroscopy and Imaging of Surface States....Pages 341-347
Building Nanostructures Atom by Atom....Pages 349-357
Back Matter....Pages 359-382

✦ Subjects

Nanotechnology; Nanotechnology and Microengineering; Condensed Matter Physics

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