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Atomic force microscopy on SiO2 layers grown on Ge implanted silicon

โœ Scribed by V. Raineri; S. Lombardo; F. Iacona; F. La Via


Book ID
113287797
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
523 KB
Volume
116
Category
Article
ISSN
0168-583X

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