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Raman Scattering Study of Tehrmal SiO2 Layers Grown on Silicon

โœ Scribed by Kodama, Takeshi; Iwaoka, Teiji; Osaka, Yukio


Book ID
111866782
Publisher
Institute of Pure and Applied Physics
Year
1985
Tongue
English
Weight
503 KB
Volume
24
Category
Article
ISSN
0021-4922

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