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Atomic force microscopy measurements of topography and friction on dotriacontane films adsorbed on a SiO[sub 2] surface

✍ Scribed by Trogisch, S.; Simpson, M. J.; Taub, H.; Volkmann, U. G.; Pino, M.; Hansen, F. Y.

Book ID: 121707984
Publisher: American Institute of Physics
Year: 2005
Tongue: English
Weight: 659 KB
Volume: 123
Category: Article
ISSN: 0021-9606
DOI: 10.1063/1.2060707

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