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Atomic force microscopy for transition metals and tip structure effects

✍ Scribed by H. Ness; D. Stoeffler; F. Gautier

Publisher
Elsevier Science
Year
1993
Weight
593 KB
Volume
294
Category
Article
ISSN
0167-2584

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While image quality from instruments such as electron microscopes, light microscopes, and confocal laser scanning microscopes is mostly influenced by the alignment of optical train components, the atomic force microscope differs in that image quality is highly dependent upon a consumable component,