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Effect of tip atomic and electronic structure on scanning tunneling microscopy/spectroscopy

โœ Scribed by Masaru Tsukuda; Katsuyoshi Kobayashi; Nobuyuki Isshiki


Publisher
Elsevier Science
Year
1991
Weight
59 KB
Volume
242
Category
Article
ISSN
0167-2584

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While image quality from instruments such as electron microscopes, light microscopes, and confocal laser scanning microscopes is mostly influenced by the alignment of optical train components, the atomic force microscope differs in that image quality is highly dependent upon a consumable component,