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Atomic force microscopy and scanning near-field optical microscopy studies on the characterization of human metaphase chromosomes

✍ Scribed by M. Oberringer; A. Englisch; B. Heinz; H. Gao; T. Martin; U. Hartmann

Publisher
Springer
Year
2003
Tongue
English
Weight
555 KB
Volume
32
Category
Article
ISSN
1432-1017

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We have demonstrated recently the operation of depolarization near-Ðeld scanning optical microscopy (DP-NSOM), a technique that allows optical near-Ðeld imaging with uncoated optical Ðbre tips by making use of the depolarizing e †ect of the tip-sample near-Ðeld. We have shown both experimentally and