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Atomic force microscopy analysis of buckling phenomena in metallic thin films on substrates

✍ Scribed by V. Branger; Ch. Coupeau; Ph. Goudeau; B. Boubeker; K. F. Badawi; J. Grilhé

Book ID
110241262
Publisher
Springer
Year
2000
Tongue
English
Weight
241 KB
Volume
19
Category
Article
ISSN
0261-8028

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