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Crystallization kinetics in ferroelectric thin films: Viability of atomic force microscopy

✍ Scribed by Ellen M. Griswold; L. Weaver; M. Sayer; F. Zcerwinski; J. Szpunar

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
489 KB
Volume
26
Category
Article
ISSN
0968-4328

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