Atomic Force Microscopy

✍ Peter Eaton, Paul West 📂 Library 📅 2010 🏛 Oxford University Press, USA 🌐 English

Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magn

📁 Atomic Force Microscopy

✍ Eaton P., West P. 📂 Library 📅 2010 🏛 OUP 🌐 English

Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magn

Atomic Force Microscopy

📁 Atomic Force Microscopy

✍ Bert Voigtländer 📂 Library 📅 2019 🏛 Springer International Publishing 🌐 English

<p><p>This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) repr

Atomic Force Microscopy/Scanning Tunneli

📁 Atomic Force Microscopy/Scanning Tunneling Microscopy

✍ J. H. Hopps (auth.), Samuel H. Cohen, Mona T. Bray, Marcia L. Lightbody (eds.) 📂 Library 📅 1994 🏛 Springer US 🌐 English

<p>The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium w

Atomic Force Microscopy Scanning Tunneli

📁 Atomic Force Microscopy Scanning Tunneling Microscopy

✍ Samuel H. Cohen, Marcia L. Lightbody 📂 Library 📅 1999 🏛 Springer 🌐 English

This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microsc

Noncontact Atomic Force Microscopy

📁 Noncontact Atomic Force Microscopy

✍ Seizo Morita (auth.), Prof. S. Morita, Prof. R. Wiesendanger, Prof. E. Meyer (ed 📂 Library 📅 2002 🏛 Springer-Verlag Berlin Heidelberg 🌐 English

<p>Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resol