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Atomic Force Microscopy

✍ Scribed by Bert Voigtländer

Publisher
Springer International Publishing
Year
2019
Tongue
English
Leaves
329
Series
NanoScience and Technology
Edition
2nd ed.
Category
Library
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✦ Synopsis

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

✦ Table of Contents

Front Matter ....Pages i-xiv
Introduction (Bert Voigtländer)....Pages 1-13
Harmonic Oscillator (Bert Voigtländer)....Pages 15-33
Technical Aspects of Atomic Force Microscopy (Bert Voigtländer)....Pages 35-67
Atomic Force Microscopy Designs (Bert Voigtländer)....Pages 69-86
Electronics and Control for Atomic Force Microscopy (Bert Voigtländer)....Pages 87-118
Lock-in Technique (Bert Voigtländer)....Pages 119-123
Data Representation and Image Processing (Bert Voigtländer)....Pages 125-135
Artifacts in AFM (Bert Voigtländer)....Pages 137-147
Work Function, Contact Potential, and Kelvin Probe AFM (Bert Voigtländer)....Pages 149-159
Forces Between Tip and Sample (Bert Voigtländer)....Pages 161-176
Cantilevers and Detection Methods in Atomic Force Microscopy (Bert Voigtländer)....Pages 177-197
Static Atomic Force Microscopy (Bert Voigtländer)....Pages 199-208
Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy (Bert Voigtländer)....Pages 209-229
Intermittent Contact Mode/Tapping Mode (Bert Voigtländer)....Pages 231-253
Mapping of Mechanical Properties Using Force-Distance Curves (Bert Voigtländer)....Pages 255-259
Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy—Non-contact Atomic Force Microscopy (Bert Voigtländer)....Pages 261-285
Noise in Atomic Force Microscopy (Bert Voigtländer)....Pages 287-300
Quartz Sensors in Atomic Force Microscopy (Bert Voigtländer)....Pages 301-307
Back Matter ....Pages 309-331

✦ Subjects

Physics; Spectroscopy and Microscopy; Nanotechnology; Nanotechnology and Microengineering; Nanoscale Science and Technology; Biological Microscopy

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