Atomic and Electrical Characterisation of Amorphous Silicon Passivation Layers

✍ Scribed by B.J. O'Sullivan; N.H. Thoan; M. Jivanescu; L. Pantisano; T. Bearda; F. Dross; I. Gordon; V. Afanas’ev; A. Stesmans; J. Poortmans

• Book ID: 116427155
• Publisher: Elsevier
• Year: 2012
• Weight: 465 KB
• Volume: 27
• Category: Article
• ISSN: 1876-6102
• DOI: 10.1016/j.egypro.2012.07.049