Electrical transport mechanisms in amorphous/crystalline silicon heterojunction: Impact of passivation layer thickness

✍ Scribed by Mikolášek, Miroslav; Nemec, Michal; Vojs, Marian; Jakabovič, Ján; Řeháček, Vlastimil; Zhang, Dong; Zeman, Miro; Harmatha, Ladislav

• Book ID: 122888229
• Publisher: Elsevier Science
• Year: 2014
• Tongue: English
• Weight: 635 KB
• Volume: 558
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/j.tsf.2014.02.068